Equipment

MRC’s 12,000 sq. ft. cleanroom supports advanced micro- and nanofabrication across silicon, III–V, and soft materials. Core capabilities include sub-20 nm electron-beam lithography, alongside deposition, etching, thermal processing, and comprehensive characterization tools.

MRC equipment is located in the North Cleanroom of the Microelectronics and Engineering Research Center (MER) on the J.J. Pickle Research Campus.

Training is required before independent use. Submit a training request for any instruments needed for your work. Once training is complete, instruments can be reserved through the Facility Billing System (FBS).

Atomic Force Microscope BRUKER Icon

Atomic Force Microscope BRUKER Icon #2

Location: MER 1.728
Metrology
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Atomic Force Microscope BRUKER Icon

Atomic Force Microscope BRUKER Icon #1

Location: MER 1.728
Metrology
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Bruker Dektak Profilometer

Bruker Dektak Profilometer

Location: MER 1.748
Metrology
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Ellipsometer J.A. Woollam IR-VASE

Ellipsometer J.A. Woollam IR-VASE

Location: MER 1.802
Metrology
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Ellipsometer J.A. Woollam M-2000 DI

Ellipsometer J.A. Woollam M-2000 DI

Location: MER 1.756A
Metrology
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JA Woollam RC2 Ellipsometer

Ellipsometer J.A. Woollam RC2

Location: MER 1.748
Metrology
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FILMETRICS F54

Filmetrics F54 UV Thin-Film Small-Spot Mapping

Location: MER 1.730
Metrology
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Four-point probe Jandel RM3000+

Jandel RM3000+ Four-point Probe

Location: MER 1.7
Metrology
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Keyence VHX Digital Microscope

Keyence VHX Digital Microscope

Location: MER 1.730
Metrology
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Optical Confocal Microscope LEXT Olympus

Laser Microscope LEXT Olympus OLS4100 Confocal

Location: MER 1.7
Metrology
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Optical Microscope #1 Olympus BH-2

Optical Microscope #1 Olympus BH-2

Location: MER 1.747
Metrology
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Optical Microscopes Olympus BX51

Optical Microscopes #2 IR Olympus BX51

Location: MER 1.748
Metrology
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SEM ZEISS Gemini 460

SEM - ZEISS Gemini 460

Location: MER 1.730A
Metrology
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Spectrophotometer Nanospec AFT 180

Spectrophotometer - Nanospec Reflectometer AFT

Location: MER 1.7
Metrology
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Sputter Coater Emitech K575X

Sputter Coater Emitech K575X - SEM Sample Preparation

Location: MER 1.730A
Metrology
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XRD Rigaku SmartLab

XRD Rigaku #1 SmartLab

Location: MER 1.802
Metrology
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XRD Rigaku #2 SmartLab

XRD Rigaku #2 SmartLab

Location: MER 1.803
Metrology
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Zeiss Delmic Cathodoluminescence

Zeiss Delmic Cathodoluminescence

Location: MER 1.728
Metrology
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